Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
---|---|---|
JOINT JEDEC/ESDA STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TEST - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL |
JS-001-2023 | Jul 2023 |
This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. NOTE Data previously generated with testers meeting all waveform criteria of ANSI/ESD STM5.1-2007 or JESD22A-114F shall be considered valid test data. Also availableJTR-001-01-12: User Guide of ANSI/ESDA/JEDEC JS-001, Human Body Model Testing of Integrated Circuits Free download.Registrationorloginrequired. |
||
Registration - Plastic Dual Upper to Bottom, 1.8 mm x 1.00 mm Pitch Connector (CMT) |
SO-032A | Jul 2023 |
Designator: PDUtBXC-H...Item: 11.14-215, AccessSTP File for SO-032ACross Reference: N/A Committee(s):JC-11.14 Free download.Registrationorloginrequired. |
||
JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES |
JEP166E | Jul 2023 |
This document defines the JC-42.6 Manufacturer ID. This document covers Manufacturer ID Codes for the following technologies: LPDDR (JESD209), LPDDR2 (JESD209-2), LPDDR3 (JESD209-3), LPDDR4 (JESD209-4), Wide-IO (JESD229), and Wide-IO2 (JESD229-2). The purpose of this document is to define the Manufacturer ID for these devices. Item No. 1725.03C. See Annex for additions/changes. To make a request for an ID code://www.ljosalfur.com/id-codes-low-power-memories Committee(s):JC-42.6 Free download.Registrationorloginrequired. |
||
LOW POWER DOUBLE DATA RATE (LPDDR) 5/5X |
JESD209-5C | Jul 2023 |
This document defines the LPDDR5/LPDDR5X standard, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this specification is to define the minimum set of requirements for a JEDEC compliant x16 one channel SDRAM device and x8 one channel SDRAM device. LPDDR5/LPDDR5X device density ranges from 2 Gb through 32 Gb. This document was created using aspects of the following standards: DDR2 (JESD79-2), DDR3 (JESD79-3), DDR4 (JESD79-4), LPDDR (JESD209), LPDDR2 (JESD209-2), LPDDR3 (JESD209-3), and LPDDR4 (JESD209-4). Available for purchase:$459.00 Add to Cart Paying JEDEC Members mayloginfor free access. |
||
ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL |
JS-002-2022 | Jun 2023 |
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. This test method combines the main features of JEDEC JESD22-C101 and ANSI/ESD S5.3.1. Free download.Registrationorloginrequired. |
||
GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID/MCM PRODUCTSStatus: ReaffirmedMay 2023 |
JEP142 | May 2023 |
This document provides guidance regarding design considerations, material assessment techniques, and recommendations for material acceptance prior to use in Hybrid/MCM Products. As part of the risk assessment process, both technical requirements and cost should be carefully considered with regard to testing/evaluating the elements of a hybrid microcircuit or Multi-chip Module (MCM) prior to material release for assembly. The intent of this document is to highlight various options that are available to the Hybrid / MCM manufacturer and provide associated guidance, not to impose a specific set of tests. Free download.Registrationorloginrequired. |
||
Graphics Double Data Rate (GDDR6) SGRAM Standard |
JESD250D | May 2023 |
This document defines the Graphics Double Data Rate 6 (GDDR6) Synchronous Graphics Random Access Memory (SGRAM) specification, including features, functionality, package, and pin assignments. The purpose of this Standard is to define the minimum set of requirements for 8 Gb through 16 Gb x16 dual channel GDDR6 SGRAM devices. System designs based on the required aspects of this standard will be supported by all GDDR6 SGRAM vendors providing compatible devices. Some aspects of the GDDR6 standard such as AC timings and capacitance values were not standardized. Some features are optional and therefore may vary among vendors. In all cases, vendor data sheets should be consulted for specifics. This document was created based on some aspects of the GDDR5 Standard (JESD212). Committee(s):JC-42.3C Free download.Registrationorloginrequired. |
||
Statistical Process Control Systems |
JESD557D | May 2023 |
This standard specifies the general requirements of a statistical process control (SPC) system. This is a revision of JESD557C. Committee(s):JC-14 Free download.Registrationorloginrequired. |
||
Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification |
JEP114A | May 2023 |
This publication is a guideline to test facilities in their efforts to establish and maintain consistent particle impact noise detection (PIND) testing. Free download.Registrationorloginrequired. |
||
Guidelines for Supplier Performance Rating |
JEP146B | May 2023 |
This publication establishes guidelines and provides examples by which customers can measure their suppliers based on mutually agreed upon objective criteria. Free download.Registrationorloginrequired. |