Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE:Status: ReaffirmedApril 1981, April 1999, March 2009 |
JESD302 | Jan 1965 |
This standard establishes the preferred rating ranges and conditions for specifying beta for low power, audio frequency transistors intended for entertainment service. Formerly known as RS-302 and EIA-302. Committee(s):JC-25 Free download.Registrationorloginrequired. |
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MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORSStatus: ReaffirmedApril 1981, April 1999, March 2009 |
JESD306 | May 1965 |
This standard provides a method of measurement for small-signal HF, VHF, and UHF power gain of low power transistors. Formerly known as RS-306 and/or EIA-306. Committee(s):JC-25 Free download.Registrationorloginrequired. |
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THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS:Status: ReaffirmedApril 1981, April 2001 |
JESD313-B | Oct 1975 |
This standard provides a test method for measuring thermal resistance for conduction cooled power transistors. Committee(s):JC-25 Free download.Registrationorloginrequired. |
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STANDARD FOR THE MEASUREMENT OF CREStatus: ReaffirmedApril 1981, April 1999, March 2009 |
JESD340 | Nov 1967 |
This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340. Committee(s):JC-25 Free download.Registrationorloginrequired. |
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THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHODStatus: ReaffirmedApril 1981, April 1999, March 2009 |
JESD353 | Apr 1968 |
This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353 Committee(s):JC-25 Free download.Registrationorloginrequired. |
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THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHzStatus: ReaffirmedApril 1981, April 1999, March 2009 |
JESD354 | Apr 1968 |
This standard provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or I/f power distribution. Formerly known as RS-354 and/or EIA-354 Committee(s):JC-25 Free download.Registrationorloginrequired. |
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DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES:Status: ReaffirmedNovember 1995, November 1999, May 2003 |
JESD370B | Feb 1982 |
This standard includes several new items and has been completely rewritten from the original EIA-370. The first is a new letter symbol C so that a JEDEC type designation may now be 2C1234, to indicate that a chip is being designated that if it were properly mounted on the package registered for the 2N1234, it would display characteristics similar to those of the 2N1234. The second major addition is the method for assigning the first numeric symbol for type designations of optoelectronic devices. ANSI/EIA-370-B-1992. Committee(s):JC-10 Free download.Registrationorloginrequired. |
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THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO:Status: ReaffirmedApril 1981, April 1999, March 2009 |
JESD371 | Feb 1970 |
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor short-circuit forward current transfer ratio, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-371 and/or EIA-371. Committee(s):JC-25 Free download.Registrationorloginrequired. |
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THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS:Status: ReaffirmedApril 1981, April 1999, March 2009 |
JESD372 | May 1970 |
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372 Committee(s):JC-25 Free download.Registrationorloginrequired. |
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METHOD OF DIODE Q MEASUREMENTStatus: ReaffirmedApril 1999, April 2002 |
JESD381-A | Nov 1981 |
This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002. Committee(s):JC-22.4 Free download.Registrationorloginrequired. |