Global Standards for the Microelectronics Industry
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Displaying 1 - 5 of 8 documents. Show5结果每个页面。
Title | Document # | Date |
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USER GUIDE FOR MICROCIRCUIT FAILURE ANALYSIS:Status: RescindedNovember 2004 |
JEB16 | Jul 1970 |
This guide defines generalized procedures for the failure analysis of monolithic integrated microelectronic circuits. Although the generalized procedural steps may apply to all microelectronic circuits, additional analysis steps unique to thin/thick film hybrid devices are not covered. Committee(s):JC-14 Free download.Registrationorloginrequired. |
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METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS:Status: ReaffirmedFebruary 1984 |
JEB5-A | Jan 1970 |
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered. Committee(s):JC-BOD Free download.Registrationorloginrequired. |
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TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS: |
JEB15 | Jan 1969 |
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits. Committee(s):JC-40 |
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USER GUIDELINES FOR QUALITY AND RELIABILITY ASSURANCE OF LSI COMPONENTSStatus: RescindedApr-87 |
JEB17 | Jan 1970 |
RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS: |
JEB19 | Jan 1972 |
This recommendation applies to MOS Shift Registers. Definitions are given for P-channel registers but are applicable to all CMOS and N-channel with changes in power supply notation. Committee(s):JC-40 |