Global Standards for the Microelectronics Industry
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Title | Document # | Date |
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ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHOD:Status: ReaffirmedOctober 2002 |
JESD24- 9 | Aug 1992 |
Test method to determine how long a device can survive a short circuit condition with a given drive level. Committee(s):JC-25 Free download.Registrationorloginrequired. |