Global Standards for the Microelectronics Industry
HSUL_12 LPDDR2 AND LPDDR3 I/O WITH OPTIONAL ODT
JESD8-22B
Published: Apr 2014
This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally 0 V to 1.2 V. The standard may be applied to ICs operating with separate VDD and VDDQ supply voltages.
Committee(s):JC-16
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